Goto Section: 73.151 | 73.153 | Table of Contents
FCC 73.152
Revised as of October 2, 2015
Goto Year:2014 |
2016
§ 73.152 Modification of directional antenna data.
(a) If, after construction and final adjustment of a directional antenna, a
measured inverse distance field in any direction exceeds the field shown on
the standard radiation pattern for the pertinent mode of directional
operation, an application shall be filed, specifying a modified standard
radiation pattern and/or such changes as may be required in operating
parameters so that all measured effective fields will be contained within
the modified standard radiation pattern. Permittees may also file an
application specifying a modified standard radiation pattern, even when
measured radiation has not exceeded the standard pattern, in order to allow
additional tolerance for monitoring point limits.
(b) If, following a partial proof of performance, a licensee discovers that
radiation exceeds the standard pattern on one or more radials because of
circumstances beyond the licensee's control, a modified standard pattern may
be requested. The licensee shall submit, concurrently, Forms 301-AM and
302-AM. Form 301-AM shall include an exhibit demonstrating that no
interference would result from the augmentation. Form 302-AM shall include
the results of the partial proof, along with full directional and
nondirectional measurements on the radial(s) to be augmented, including
close-in points and a determination of the inverse distance field in
accordance with § 73.186.
(c) Normally, a modified standard pattern is not acceptable at the initial
construction permit stage, before a proof-of-performance has been completed.
However, in certain cases, where it can be shown that modification is
necessary, a modified standard pattern will be acceptable at the initial
construction permit stage. Following is a non-inclusive list of items to be
considered in determining whether a modification is acceptable at the
initial construction permit stage:
(1) When the proposed pattern is essentially the same as an existing pattern
at the same antenna site. (e.g., A DA-D station proposing to become a DA-1
station.)
(2) Excessive reradiating structures, which should be shown on a plat of the
antenna site and surrounding area.
(3) Other environmental factors; they should be fully described.
(4) Judgment and experience of the engineer preparing the engineering
portion of the application. This must be supported with a full discussion of
the pertinent factors.
(d) The following general principles shall govern the situations in
paragraphs (a), (b), and (c) in this section:
(1) Where a measured field in any direction will exceed the authorized
standard pattern, the license application may specify the level at which the
input power to the antenna shall be limited to maintain the measured field
at a value not in excess of that shown on the standard pattern, and shall
specify the common point current corresponding to this power level. This
value of common point current will be specified on the license for that
station.
(2) Where any excessive field does not result in objectionable interference
to another station, a modification of construction permit application may be
submitted with a modified standard pattern encompassing all augmented
fields. The modified standard pattern shall supersede the previously
submitted standard radiation pattern for that station in the pertinent mode
of directional operation. Following are the possible methods of creating a
modified standard pattern:
(i) The modified pattern may be computed by making the entire pattern larger
than the original pattern (i.e., have a higher RMS value) if the measured
fields systematically exceed the confines of the original pattern. The
larger pattern shall be computed by using a larger multiplying constant, k,
in the theoretical pattern equation (Eq. 1) in § 73.150(b)(1).
(ii) Where the measured field exceeds the pattern in discrete directions,
but objectionable interference does not result, the pattern may be expanded
over sectors including these directions. When this “augmentation” is
desired, it shall be achieved by application of the following equation:
E(φ,θ)aug = √{ E(φ,θ)std }2 + A{g(θ) cos (180 DA/S }2
where:
E(φ,θ)std is the standard pattern field at some particular azimuth and
elevation angle, before augmentation, computed pursuant to Eq. 2,
§ 73.150(b)(1)(i).
E(φ,θ)aug. is the field in the direction specified above, after
augmentation.
A = E(φ, O)2aug−E(φ, O)2std in which φ is the central azimuth of
augmentation. E(φ, O)aug and E(φ, O)std are the fields in the horizontal
plane at the central azimuth of augmentation.
Note: “A” must be positive, except during the process of converting
non-standard patterns to standard patterns pursuant to the Report and Order
in Docket No. 21473, and in making minor changes to stations with patterns
developed during the conversion. However, even when “A” is negative, “A”
cannot be so negative that E(φ,α)aug is less than E(φ,θ)th at any azimuth or
vertical elevation angle.
g(θ) is defined in § 73.150(b)(1)(i).
S is the angular range, or “span”, over which augmentation is applied. The
span is centered on the central azimuth of augmentation. At the limits of
the span, the augmented pattern merges into the unaugmented pattern. Spans
may overlap.
DA is the absolute horizontal angle between the azimuth at which the
augmented pattern value is being computed and the central azimuth of
augmentation. (DA cannot exceed 1/2 S.)
In the case where there are spans which overlap, the above formula shall be
applied repeatedly, once for each augmentation, in ascending order of
central azimuth of augmentation, beginning with zero degrees representing
true North. Note that, when spans overlap, there will be, in effect, an
augmentation of an augmentation. And, if the span of an earlier augmentation
overlaps the central azimuth of a later augmentation, the value of “A” for
the later augmentation will be different than the value of “A” without the
overlap of the earlier span.
(iii) A combination of paragraphs (d)(2)(i) and (d)(2)(ii), of this section,
with (d)(2)(i) being applied before (d)(2)(ii) is applied.
(iv) Where augmentation is allowable under the terms of this section, the
requested amount of augmentation shall be centered upon the measured radial
and shall not exceed the following:
(A) The actual measured inverse distance field value, where the radial does
not involve a required monitoring point.
(B) 120% of the actual measured inverse field value, where the radial has a
monitoring point required by the instrument of authorization.
Whereas some pattern smoothing can be accommodated, the extent of the
requested span(s) shall be minimized and in no case shall a requested
augmentation span extend to a radial azimuth for which the analyzed
measurement data does not show a need for augmentation.
(3) A Modified Standard Pattern shall be specifically labeled as such, and
shall be plotted in accordance with the requirements of paragraph (b)(2) of
§ 73.150. The effective (RMS) field strength in the horizontal plane of
E(φ,α)std, E(φ,α)th, and the root sum square (RSS) value of the inverse
fields of the array elements (derived from the equation for E(φ,α)th), shall
be tabulated on the page on which the horizontal plane pattern is plotted.
Where sector augmentation has been employed in designing the modified
pattern, the direction of maximum augmentation (i.e., the central azimuth of
augmentation) shall be indicated on the horizontal plane pattern for each
augmented sector, and the limits of each sector shall also be shown. Field
values within an augmented sector, computed prior to augmentation, shall be
depicted by a broken line.
(4) There shall be submitted, for each modified standard pattern, complete
tabulations of final computed data used in plotting the pattern. In
addition, for each augmented sector, the central azimuth of augmentation,
span, and radiation at the central azimuth of augmentation (E(φ,α)aug) shall
be tabulated.
(5) The parameters used in computing the modified standard pattern shall be
specified with realistic precision. Following is a list of the maximum
acceptable precision:
(i) Central Azimuth of Augmentation: to the nearest 0.1 degree.
(ii) Span: to the nearest 0.1 degree.
(iii) Radiation at Central Azimuth of Augmentation: 4 significant figures.
(e) Sample calculations for a modified standard pattern follow. First,
assume the existing standard pattern in § 73.150(c). Then, assume the
following augmentation parameters:
Augmentation number Central azimuth Span Radiation at central azimuth
1 110 40 1,300
2 240 50 52
3 250 10 130
Following is a tabulation of part of the modified standard pattern:
Azimuth 0 30 60 Vertical angle
0 28.86 68.05 72.06
105 1,299.42 872.14 254.21
235 39.00 35.74 38.71
247 100.47 66.69 32.78
[ 46 FR 11992 , Feb. 12, 1981, as amended at 56 FR 64862 , Dec. 12, 1991; 66 FR 20756 , Apr. 25, 2001]
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Goto Section: 73.151 | 73.153
Goto Year: 2014 |
2016
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